REU/RET Projects

Donald Conkey
University: Brigham Young University
Mentor in UCF: Dr. R. Vanfleet - Physics

Preparation of γ-LiAlO2 and GaN for Transmission Electron Microscopy Analysis and Characterization

In order to explore the characteristics of Gallium Nitride grown on Lithium Aluminate by Halide Vapor Phase Epitaxy (HVPE) both GaN and LiAlO2 must be characterized by electron microscopy. GaN and LiAlO2 are very brittle materials that take a lot of effort and care to prepare for TEM analysis. This paper explores how to create the best samples for TEM analysis and analyzes some of the images that came from the prepared samples.